IEC 60749-36-2003 半导体器件.机械和气候试验方法.第36部分:稳态加速

标准号：IEC 60749-36-2003
中文标准名称：半导体器件.机械和气候试验方法.第36部分:稳态加速
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
标准类型：L40
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：This part of IEC 60749 provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test. It may be used as a high stress (destructive) test to determine the mechanical limits of the package, internal metallisation and lead system, die or substrate attachment, and other elements of the microelectronic device. When proper stress levels have been established this test method may also be employed as a non-destructive in-line 100 % screen to detect and eliminate devices with lower than normal mechanical strengths in any of the structural elements. In general, this acceleration steady-state test method is in conformity with IEC 60068-2-7 but, due to specific requirements of semiconductors, the clauses of this standard apply.