IEC 62526-2007 半导体设计环境用标准试验接口语言(STIL)扩展标准

标准号：IEC 62526-2007
中文标准名称：半导体设计环境用标准试验接口语言(STIL)扩展标准
英文标准名称：Standard for extensions to Standard Test Interface Language (STIL) for semiconductor design environments
标准类型：L74
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L74
国际标准分类号：25.040
适用范围：Structures are defined in STIL to support usage as semiconductor simulation stimulus, including(1) mapping signal names to equivalent design references, (2) interface between scan and built-in self test(BIST) and the logic simulation, (3) data types to represent unresolved states in a pattern, (4) parallel orasynchronous pattern execution on different design blocks, and (5) expression-based conditional executionof pattern constructs.Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design4(i.e., embedded cores) such that these tests can be incorporated into a complete higher level device test.Structures are defined in STIL to relate fail information from device testing environments back to originalstimulus and design data elements.